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High-resolution surface morphology imaging
Particle size, shape and distribution analysis
Elemental mapping and composition via EDX (Energy Dispersive X-Ray)
Fracture surface and microstructure analysis
Reports in the form of PDF file/high-resolution images
Field Emission Scanning Electron Microscopy (FESEM) uses a focused, high-energy electron beam to produce extremely high-resolution images of a sample's surface. It reveals fine details of surface morphology, texture and particle structure at the nanoscale, and when combined with EDX, also provides elemental composition data across the imaged area.
Samples should be dry, vacuum-stable and small enough to fit the sample stub. Non-conductive samples may require a thin conductive coating (e.g. gold or carbon) prior to imaging.
FESEM can typically resolve features from the micron scale down to a few nanometers, making it suitable for detailed surface and particle characterization across a wide range of materials.
